E32-A09H Optical fiber sensor

Measurable at any position.
The usual limitations, such as the ''measurement,
area being confined to the center''
or ''large errors due to positioning'',
that used to plague laser measuring sensors,
have now been overcome. Measurements can be,
consistently taken within a 500 mm area,
whatever stage the work is at or whichever way it is inserted E32-A09H.
It can now be set to positions without interference from,
the work feed and without limitations of size of work area E32-A09H E32-R21 type: special beam; Coaxial / spot,
Specialty: M6 screw,
Bending radius (mm): R25.
Standard test object (minimum test object) (mm) 1: (0.005),
Fiber element for meeting diversified needsAppearance: Unshielded, M12.
Sensing distance: 12 mm E32-A09H.
Model: Operation mode, NO.
Proximity Sensor with a Long Screw Length.
Increased tightening strength. Cable protectors,
provided as a standard feature.
Increased indicator visibility.
A milled section for wrench grip on all models. Power supply voltage: AC/DC power supply selectable type.
Sensing method: Diffuse-reflective.
Sensing distance: 2.5 m.
Output configu ration: Relay E32-A09H.
Long-distance Photoelectric Sensor.
That Supports AC/DC Power Supplies.
Long sensing distance that is approximately 8,
times that of our conventional model (for the,
Through-beam and Diffuse-reflective models).
(Through-beam: 40 m, Retro-reflective: 7 m, and,
Diffuse-reflective: 2.5 m.) .
Improved visibility:
A red LED that makes the spot visible.
Large indicators that can be seen even from a,
distance.
Improved operability.
(Enlarged sensitivity adjuster and operation selector)
Freely selectable power supply input (24 to 240 VDC, 24 to 240 VAC) E32-A09H.
(Additional types added to the DC type lineup.)
Models with infrared LEDs are also available. E3F3-T11M detection methods: the firing pattern,
Wire lead out type,
Type: metal appearance; NPN output,
Threaded cylindrical phhotoelectric sensor, built-in amplifier,
Photoelectric sensor with proximity sensor appearance
High anti interference with optoelectronic -IC technology